SIMcheck: a Toolbox for Successful Super-resolution Structured Illumination Microscopy
نویسندگان
چکیده
Three-dimensional structured illumination microscopy (3D-SIM) is a versatile and accessible method for super-resolution fluorescence imaging, but generating high-quality data is challenging, particularly for non-specialist users. We present SIMcheck, a suite of ImageJ plugins enabling users to identify and avoid common problems with 3D-SIM data, and assess resolution and data quality through objective control parameters. Additionally, SIMcheck provides advanced calibration tools and utilities for common image processing tasks. This open-source software is applicable to all commercial and custom platforms, and will promote routine application of super-resolution SIM imaging in cell biology.
منابع مشابه
Erratum: SIMcheck: a Toolbox for Successful Super-resolution Structured Illumination Microscopy
In the Supplementary Information file originally published with this Article, the details of the beta testers in Supplementary Table S11 were incorrect. These errors have been corrected in the Supplementary Information that now accompanies the Article. This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article a...
متن کاملCorrection: Localized plasmon assisted structured illumination microscopy for wide-field high-speed dispersion-independent super resolution imaging.
Correction for 'Localized plasmon assisted structured illumination microscopy for wide-field high-speed dispersion-independent super resolution imaging' by Joseph Louis Ponsetto et al., Nanoscale, 2014, 6, 5807-5812.
متن کاملLive Cell Imaging With Spatial Light Modulator-based Optical Sectioning Structured Illumination Microscopy
Structured illumination microscopy (SIM) is a method in fluorescence microscopy which works by acquiring a set of images using widefield detection. Each image in the set is made with a different position of an illumination mask, but with no mask in the detection path [1]. Subsequent image processing is used to produce an optically sectioned image (OS-SIM) [2 4], or an image with resolution beyo...
متن کاملWide field super-resolution surface imaging through plasmonic structured illumination microscopy.
We experimentally demonstrate a wide field surface plasmon (SP) assisted super-resolution imaging technique, plasmonic structured illumination microscopy (PSIM), by combining tunable SP interference (SPI) with structured illumination microscopy (SIM). By replacing the laser interference fringes in conventional SIM with SPI patterns, PSIM exhibits greatly enhanced resolving power thanks to the u...
متن کاملSuper-resolution two-photon microscopy via scanning patterned illumination.
We developed two-photon scanning patterned illumination microscopy (2P-SPIM) for super-resolution two-photon imaging. Our approach used a traditional two-photon microscopy setup with temporally modulated excitation to create patterned illumination fields. Combing nine different illuminations and structured illumination reconstruction, super-resolution imaging was achieved in two-photon microsco...
متن کامل